Instruction/ maintenance manual of the product JSM-6060LV Dell
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JEOL JSM-6060L V SCANNING ELECTR ON MICR OSCOPE Insert Nickname Her e Operating Instr uctions.
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 1 T able of Contents 1 INTRODUCTION Safety 3 2 BACKGROUND Background Inf ormation 4 References 4 3 SAMPLES Sample Holders 7 Sample Preparation 7 4 OPERATIO.
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 2 Introduction he JEOL JSM-6060LV is a sta te-of-the-art scanning electron microscope that features a low vacuum for observation of non-conductive specimen.
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 3 Background The scanning electron microscope (SEM) is one of the most versatile instruments for the examination and analysis of the microstructural ch aracteristics of solids.
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 4 Figure 2. Schematic illustration of SEM electron The basic components of a SEM are the vacuum system, electron gun, lens system, electron detector, imaging system, and the electronics asso ciate d with these components.
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 5 Samples he JEOL JSM-6060LV in stan dard high vacuum operatin g mode can handle a variety of sample types. The low vacuum mode enables the instrument to handle non- conductive samples, including organic materia ls (polymers, etc.
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 6 2. Remove excess lint, dust, moisture, and other debr is from your specimen, unless you want to examine those things. 3. Use the sputter coater to create a conductive gold coating on the surface of your sample.
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 7 Instrument Operation his section will walk you through the basic operation of the scanning electron microscope.
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 8 6. Close the chamber door by gently pushing it fo rward until it stops. 7. Press and hold the EVAC button (on the front of the instrument) until it lights up green. 8. WAIT for evacuation of the chamber (about 1 minut e).
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 9 3. Tilt. Turn the knob at the lower right side of the chamber d oor assembly to tilt your specimen. BE CAREF UL when adjusting the sample tilt – you don’t want to run your sample into anything inside the column.
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 10 Photography cquiring an image from the SEM is relative ly easy, but there are quite a few options for live image scanning and corresponding image resolution.
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 11 4. Once the image is frozen, click the Save button above the image, select a save directory, type a filename, select a fi le format, and click Save . Higher R esolution (slow er) Photos 1. Press the green Scan2 button on the toolbar.
An important point after buying a device Dell JSM-6060LV (or even before the purchase) is to read its user manual. We should do this for several simple reasons:
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If you already are a holder of Dell JSM-6060LV, but have not read the manual yet, you should do it for the reasons described above. You will learn then if you properly used the available features, and whether you have not made any mistakes, which can shorten the lifetime Dell JSM-6060LV.
However, one of the most important roles played by the user manual is to help in solving problems with Dell JSM-6060LV. Almost always you will find there Troubleshooting, which are the most frequently occurring failures and malfunctions of the device Dell JSM-6060LV along with tips on how to solve them. Even if you fail to solve the problem, the manual will show you a further procedure – contact to the customer service center or the nearest service center